Y. Wang* and S. Zhang, "Three-dimensional shape measurement with binary dithered patterns," Appl. Opt. 51(27), 6631-6636, 2012; doi: 10.1364/AO.51.006631
The previously proposed binary defocusing technique and its variations have proven successful for high-quality three-dimensional (3D) shape measurement when fringe stripes are relatively narrow, but they suffer if fringe stripes are wide. This paper proposes to utilize the binary dithering technique to conquer this challenge. Both simulation and experimental results show the phase error is always less than 0.6% even when the fringe stripes are wide and the projector is nearly focused.