H. Sheng, J. Xu, and S. Zhang, "Dynamic projection theory for fringe projection profilometry," Appl. Opt., 56(30), 8452-8460 (2017); doi: 10.1364/AO.56.008452
Fringe projection profilometry (FPP) has been widely used for 3D reconstruction, surface measurement and reverse engineering. However, fringe projection profilometry is prone to overexposure if objects have a wide range of reflectance. In this paper, we propose a dynamic projection theory based on fringe projection profilometry to rapidly measure the overexposed region with an attempt to conquer this challenge. This theory modifies the projected fringe image to the next better measurement based on the feedback provided by the previously captured image intensity. Experiments demonstrated that the number of overexposed points can be drastically reduced after one or two iterations. Compared with the state-of-the-art methods, our proposed dynamic projection theory measures the overexposed region quickly and effectively, and thus broadens the applications of fringe projection profilometry.